Iranian Knowledge-Based Firm Produces Atomic Force Microscope for Nanoscale Imaging
7:34 - December 31, 2024

Iranian Knowledge-Based Firm Produces Atomic Force Microscope for Nanoscale Imaging

TEHRAN (ANA)- An Iranian knowledge-based company stationed at Pardis Science and Technology Park has managed to produce an atomic force microscope which is used to image and characterize samples at the nanoscale.
News ID : 7855

“One of our knowledge-based products is the atomic force microscope, which is used to image and characterize samples at the nanoscale. This device uses a sharp-pointed probe to scan the sample surface. During the scanning operation, laser light is emitted to the back of the cantilever and its reflection on a photodiode will result in the formation of an image of the sample surface,” said Seyed Abbas Shahmoradi, the managing director of the knowledge-based company.

He mentioned the Bio-AFM as another achievement of his company, and said, "This microscope is one of the most important tools for studying samples in biology, because Bio-AFM provides a suitable platform for integrating atomic force microscopy and optical microscopy in biological research projects."

Noting that the Bio-AFM microscope can capture images in different environments with diverse working modes, Shahmoradi said, “This capability allows scientists to study the structure and properties of living cells and other biological samples like DNA and RNA, proteins, viruses, bacteria, and tissues."

“Also, the Transmission Electron Microscopy (TEM) produced by our company, with an accuracy of 0.6 nanometers, is capable of providing images with extremely high resolution. For comparison, the size of the coronavirus is 120 nanometers, while the accuracy of our device is one two-hundredth of this value,” he added.

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1,000 times better than the optical diffraction limit.

It is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1,000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force.

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